IMS Manthan (The Journal of Mgt., Comp. Science & Journalism)

1. S.A. Gangawane – Holography and Materials Res.Lab, Dept. of Physics, Shivaji Univ., Kolhapur, Maharashtra, India.

2. V.P. Malekar – Holography and Materials Res.Lab, Dept. of Physics, Shivaji Univ., Kolhapur, Maharashtra, India.

3. V.J. Fulari – Holography and Materials Res.Lab, Dept. of Physics, Shivaji Univ., Kolhapur, Maharashtra, India.

Received
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Accepted
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Published
21-Jun-2014
Abstract
In this paper, the effects of electron beam irradiation on the CdTe thin films are studied. The CdTe thin films are characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and contact angle measurements for different bath concentration. The thin film layers are subjected to irradiation of 6 MeV electrons. Finally the effect of irradiation is correlated to crystal size, grain size and contact angle measurements of the CdTe thin films.
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